Pat Byrne is the Chief Executive Officer for GE Digital, leading the company’s strategy to focus GE on the IIoT opportunities for GE’s core businesses, while continuing to support and grow its existing digital portfolio. He also serves as VP, Lean Transformation for GE. With a background that spans more than three decades of deep domain expertise in technology and strategic business development, Pat has considerable experience running businesses and collaborating across businesses within large organizations.
Pat joined GE from Fortive, where he most recently served as Senior Vice President, leading their Product Realization business. Prior to Fortive, Pat was the Vice President of Strategy and Chief Technology Officer for Danaher’s test and measurement segment, where he drove strategic market development, business development and M&A. Pat also served as President of Tektronix, a leading worldwide provider of measurement solutions, and President and CEO of Intermec Technologies and Agilent’s electronic measurement group. Pat began his career at Hewlett-Packard, holding various leadership roles in R&D, technology development, marketing, quality and general management. Throughout his career, Pat has served as a member of the board of directors for multiple publicly-traded companies, including Micron Technology, the global leader in memory solutions.
Pat holds a B.S. in Electrical Engineering from the University of California, Berkeley, and an M.S. in Electrical Engineering from Stanford University.