Michelle graduated from the University of Texas at San Antonio, with a B.S. in Geology. She started in the Materials Characterization group at GE in 1998 in the X-ray Diffraction team, and later transitioned to the SEM team to specialize in residual plastic strain measurements via Electron Backscatter Diffraction (EBSD). Over time, Michelle has gained experience in other microscopy techniques such as Energy Dispersive Spectroscopy (EDS), Computed Tomography (CT), Electron Beam Induced Current (EBIC) for a variety of different programs.
As an extremely myopic kid, I was always fascinated by studying objects closely and comparing similarities and differences. Because of this, microscopy is a seemingly perfect career choice for someone that enjoyed looking at common yard items on a hand-me-down optical microscope. These days, the microscope is far more powerful (and expensive), but the joy of looking at tiny features to solve physical world problems is the same as it was when looking at yard critters so many years ago. Because of the diversity of materials GE uses for a wide variety of applications, it creates a dynamic atmosphere of continuous learning and developing. Basically, if you’re bored here, you’re doing something wrong.
2013Cosslett Award: Best Invited Paper M&M 2012
Macres Award: Best Instrumentation/Software Paper2002