Ian joined the characterization team in 2009. He is a lead engineer and EBSD expert specializing in characterization methods required for materials development, process design, and failure analysis. Ian is especially proficient in characterization of superalloys for additive manufacturing applications. Before joining GE, Ian completed his graduate work at Alfred University in the field of biomedical materials science & engineering. He served as secretary of the Capital District Microscopy & Microanalysis Society from 2011-2013. In 2014, he received the Technical Excellence Award for his work on the 9X disk development program.
It’s tough to imagine an environment more diverse, dynamic, and distinguished than GE Research. There’s absolutely no better place than to quench one’s thirst for ingenuity, creativity, and problem solving.