Christopher started at GE Research in 2005 after working for an OEM robotics company for 10 years specializing in custom machine controls. Since being at GE Research, he has helped develop test apparatus for various technologies throughout the business.
- Developed M40 foam cleaning process hardware for on wing cleaning and repair method for lowering EGT margin during maintenance interval.
- Designed next generation JETs rigs for high-temperature materials testing.
- Developed new TE conductivity probe interface increasing the sample rate of semiconductor material testing for product validation and control.
- Developed analog amplifier for control of laser output power module used in additive manufacturing. Hardware solution gives seamless installation for software team to manipulate laser stage output power in real time for testing and data acquisition.